Tomocube Debuts HT-T1D for 3D Glass Substrate Defect Analysis

The HT-T1D system moves beyond standard automated optical inspection by reconstructing the interior of glass substrates in three dimensions. Using visible-light holotomography, the device maps refractive-index distributions to uncover the precise location, morphology, and depth of internal flaws. Because the process is non-destructive, engineers can track how individual defects evolve across different manufacturing stages, such as laser drilling or etching, potentially reducing analysis time from weeks to minutes.

To support this hardware, the company also launched its TAMI software platform. This interface processes 3D refractive-index data to generate actionable engineering reports. According to CEO YongKeun Park, the system is engineered to help manufacturers move quickly from defect detection to root-cause analysis, a transition he identifies as essential for competitive mass production. Beyond defect identification, the technology is also capable of functional metrology for glass photonic integrated substrates used in co-packaged optics, where refractive index measurements directly correlate to device performance.